AESOP is a suite of Maple procedures which allows limited symbolic ray tracing of simple optical systems. AESOP is useful for analyzing the effects of small optical element misalignments or other perturbations. (It is possible to include two or more independent perturbations.) Specifically, wavefront aberrations and optical path variations can be studied as functions of the perturbation parameters. The power of this approach lies in the fact that the results can be manipulated algebraically, allowing determination of misalignment tolerances as well as developing physical intuition, especially in the picometer regime of optical path length variations.
About AESOP |
(9-24-96) | |
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Example Files |
(11-04-96) | |
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AESOP-Related Papers |
(10-16-97) | |
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Source Files |
(11-04-96) | |
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Known Problems |
(10-23-96) |
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Last changed: 16 October 1997
